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公開日
2025-05-15
公報種別
公開国際商標公報
国際登録番号
1842740
国際登録日
2024-08-27
区分
第9類(機械器具)
,
第37類(建設)
,
第42類(科学・技術)
商品役務
Scientific
,
measuring and detecting apparatus and instruments; scientific
,
measuring and detecting apparatus and instruments
,
namely
,
spectrometers
,
X-ray fluorescence analysers and spectrometers
,
diffractometers
,
X-ray diffractometers and wafer analysers
,
neutron activation analysers
,
pulsed fast and thermal neutron activation analysers; X-ray fluorescence analysers and spectrometers; X-ray fluorescence (XRF) analysers and spectrometers; X-ray detecting apparatus and instruments; X-ray detectors; X-ray detectors not for medical purposes; X-ray measuring
,
detecting and monitoring instruments
,
indicators and controllers not for medical purposes; spectrometers; spectrophotometers; spectrometry apparatus; X-ray spectroscopy apparatus [other than for medical use]; elemental analysers; X-ray analysers; X-ray neutron activation analysers; X-ray pulsed fast and thermal neutron activation analysers; ICP (inductively coupled plasma) spectroscopy apparatus and instruments; X-ray analytical apparatus; X-ray apparatus not for medical use; diffraction apparatus [microscopy]; diffraction apparatus for microscopy; diffraction apparatus and instruments; diffractometers; X-ray diffraction apparatus
,
X-ray diffractometers; X-ray fluorescence diffractometers; X-ray diffractometers and wafer analysers; wafer analysers; X-ray imaging detectors; X-ray diffraction instruments
,
including X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers
,
and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry
,
for analysing film thickness
,
composition and density; X-ray measuring
,
detecting and monitoring instruments
全 169 件を表示
,
indicators and controllers; analytical apparatus for use in analysing samples of composites for use in scientific
,
industrial and laboratory applications
,
including X-ray diffraction and spectrometry apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray analysers
,
X-ray fluorescence spectrometers
,
wafer analysers
,
X-ray tubes; materials characterization apparatus
,
including scientific and measuring apparatus and instruments
,
including spectrometers
,
X-ray fluorescence analysers and spectrometers
,
diffractometers
,
X-ray diffractometers and wafer analysers; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments
,
namely
,
spectrometers
,
X-ray fluorescence analysers and spectrometers
,
diffractometers
,
X-ray diffractometers and wafer analysers; photon counting X-ray detectors; X-ray tubes
,
not for medical purposes; analytical
,
process control and measuring apparatus
,
including reflectometers
,
spectrometers
,
X-ray fluorescence analysers and X-ray diffraction meters; analytical
,
process control and measuring apparatus
,
namely
,
reflectometers
,
spectrometers
,
X-ray fluorescence analysers and X-ray diffraction meters; analytical
,
process control and measuring apparatus
,
including reflectometers
,
spectrometers
,
X-ray fluorescence analysers and X-ray diffraction meters for the cement
,
steel
,
aluminium
,
petrochemicals
,
industrial minerals
,
glass and polymers industry
,
and to customers in research and development institutions; metrology tools
,
including reflectometers
,
spectrometers
,
X-ray fluorescence analysers and X-ray diffraction meters; metrology tools
,
namely
,
reflectometers
,
spectrometers
,
X-ray fluorescence analysers and X-ray diffraction meters; reflectometers
,
spectrometers
,
X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; computer software; computer software for analysis purposes; computer software for use in relation to spectrometry; downloadable or recorded computer software for use in relation to spectrometry; computer software for analysis purposes; downloadable or recorded computer software for analysis purposes; computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to diffractometry; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus not for medical use; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; computer software for use in relation to the determination of the thickness of layer samples; downloadable or recorded computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; downloadable or recorded computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; downloadable or recorded computer software for use in relation to the standardless analysis of samples; parts and fittings for all the aforesaid goods; component parts and fittings for all the aforesaid goods.
,
Installation
,
maintenance and repair of scientific and measuring apparatus and instruments; installation
,
maintenance and repair of X-ray fluorescence (XRF) analysers and spectrometers
,
spectrometry apparatus
,
X-ray detectors
,
X-ray analytical apparatus
,
X-ray imaging detectors
,
photon counting X-ray detectors
,
X-ray diffraction apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray analysers
,
wafer analysers
,
materials characterization apparatus
,
X-ray tubes
,
elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; installation of scientific and measuring apparatus and instruments; installation of X-ray fluorescence (XRF) analysers and spectrometers
,
spectrometry apparatus
,
X-ray detectors
,
X-ray analytical apparatus
,
X-ray imaging detectors
,
photon counting X-ray detectors
,
X-ray diffraction apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray analysers
,
wafer analysers
,
materials characterization apparatus
,
X-ray tubes
,
elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; information
,
advisory and consultancy services all relating to the aforesaid.
,
Scientific and technological services and research and design relating thereto; scientific services and design relating thereto; design and development of scientific and measuring apparatus and instruments; industrial analysis and industrial research services; scientific analysis; analysis of materials; laboratory services for analytical testing; elemental analysis; technological services in the field of spectrometry and diffractometry; technological services relating to ICP (inductively coupled plasma) spectroscopy; industrial analysis and research services in the field of spectrometry
,
diffractometry and ICP (inductively coupled plasma) spectroscopy; design and development of X-ray apparatus
,
X-ray fluorescence (XRF) analysers and spectrometers
,
X-ray analytical apparatus
,
analytical apparatus
,
X-ray diffraction apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray detectors
,
X-ray imaging detectors
,
photon counting X-ray detectors
,
X-ray analysers
,
wafer analysers
,
X-ray tubes
,
elemental spectrometry apparatus and instruments
,
ICP (inductively coupled plasma) spectroscopy apparatus and instruments; design and development of computer hardware and software; design
,
development and programming of computer software; design
,
development and programming of computer software in the field of spectrometry
,
diffractometry and ICP (inductively coupled plasma) spectroscopy; leasing and rental of scientific and measuring apparatus and instruments; leasing and rental of scientific and measuring apparatus
,
namely X-ray fluorescence (XRF) analysers and spectrometers
,
elemental spectrometry apparatus and instruments
,
X-ray detectors
,
X-ray imaging detectors
,
photon counting X-ray detectors
,
X-ray analytical apparatus
,
X-ray apparatus
,
X-ray diffraction apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray analysers
,
wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments
,
X-ray detectors
,
X-ray imaging detectors
,
photon counting X-ray detectors
,
X-ray analytical apparatus
,
analytical apparatus
,
X-ray apparatus
,
X-ray diffraction apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray analysers
,
wafer analysers and X-ray tubes; technological consultancy services and telecommunications technology consultancy services relating to the selection
,
operation
,
and use of scientific and measuring apparatus and instruments
,
X-ray detectors
,
X-ray imaging detectors
,
photon counting X-ray detectors
,
X-ray analytical apparatus
,
X-ray apparatus
,
X-ray diffraction apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray analysers
,
wafer analysers
,
X-ray tubes
,
and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; technological consultancy services and telecommunications technology consultancy services relating to the selection
,
operation
,
and use of scientific and measuring apparatus and instruments
,
X-ray fluorescence (XRF) analysers and spectrometers
,
X-ray detectors
,
X-ray imaging detectors
,
photon counting X-ray detectors
,
X-ray analytical apparatus
,
analytical apparatus
,
X-ray apparatus
,
X-ray diffraction apparatus
,
diffractometers
,
X-ray diffractometers
,
X-ray analysers
,
wafer analysers
,
X-ray tubes
,
elemental spectrometry apparatus and instruments
,
and ICP (inductively coupled plasma) spectroscopy apparatus and instruments.
基礎出願番号
UK00004032110
基礎出願日
2024-03-28
基礎出願国
GB
出願人
Malvern Panalytical B.V.
OCRテキスト
REVONTIUM
OCRテキスト2
REVONTIUM
OCRについて
この商標をJ-PlatPatで参照する
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