TOP特許意匠商標
商標ウォッチ Twitter
公開日2025-05-15
公報種別公開国際商標公報
国際登録番号1842740
国際登録日2024-08-27
区分第9類(機械器具),第37類(建設),第42類(科学・技術)
商品役務Scientific, measuring and detecting apparatus and instruments; scientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray fluorescence analysers and spectrometers; X-ray fluorescence (XRF) analysers and spectrometers; X-ray detecting apparatus and instruments; X-ray detectors; X-ray detectors not for medical purposes; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; spectrometers; spectrophotometers; spectrometry apparatus; X-ray spectroscopy apparatus [other than for medical use]; elemental analysers; X-ray analysers; X-ray neutron activation analysers; X-ray pulsed fast and thermal neutron activation analysers; ICP (inductively coupled plasma) spectroscopy apparatus and instruments; X-ray analytical apparatus; X-ray apparatus not for medical use; diffraction apparatus [microscopy]; diffraction apparatus for microscopy; diffraction apparatus and instruments; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray fluorescence diffractometers; X-ray diffractometers and wafer analysers; wafer analysers; X-ray imaging detectors; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; X-ray measuring, detecting and monitoring instruments全 169 件を表示, indicators and controllers; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, including X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus, including scientific and measuring apparatus and instruments, including spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; photon counting X-ray detectors; X-ray tubes, not for medical purposes; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; metrology tools, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; computer software; computer software for analysis purposes; computer software for use in relation to spectrometry; downloadable or recorded computer software for use in relation to spectrometry; computer software for analysis purposes; downloadable or recorded computer software for analysis purposes; computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to diffractometry; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus not for medical use; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; computer software for use in relation to the determination of the thickness of layer samples; downloadable or recorded computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; downloadable or recorded computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; downloadable or recorded computer software for use in relation to the standardless analysis of samples; parts and fittings for all the aforesaid goods; component parts and fittings for all the aforesaid goods.,Installation, maintenance and repair of scientific and measuring apparatus and instruments; installation, maintenance and repair of X-ray fluorescence (XRF) analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; installation of scientific and measuring apparatus and instruments; installation of X-ray fluorescence (XRF) analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; information, advisory and consultancy services all relating to the aforesaid.,Scientific and technological services and research and design relating thereto; scientific services and design relating thereto; design and development of scientific and measuring apparatus and instruments; industrial analysis and industrial research services; scientific analysis; analysis of materials; laboratory services for analytical testing; elemental analysis; technological services in the field of spectrometry and diffractometry; technological services relating to ICP (inductively coupled plasma) spectroscopy; industrial analysis and research services in the field of spectrometry, diffractometry and ICP (inductively coupled plasma) spectroscopy; design and development of X-ray apparatus, X-ray fluorescence (XRF) analysers and spectrometers, X-ray analytical apparatus, analytical apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, ICP (inductively coupled plasma) spectroscopy apparatus and instruments; design and development of computer hardware and software; design, development and programming of computer software; design, development and programming of computer software in the field of spectrometry, diffractometry and ICP (inductively coupled plasma) spectroscopy; leasing and rental of scientific and measuring apparatus and instruments; leasing and rental of scientific and measuring apparatus, namely X-ray fluorescence (XRF) analysers and spectrometers, elemental spectrometry apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; technological consultancy services and telecommunications technology consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, X-ray tubes, and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; technological consultancy services and telecommunications technology consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray fluorescence (XRF) analysers and spectrometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, and ICP (inductively coupled plasma) spectroscopy apparatus and instruments.
基礎出願番号UK00004032110
基礎出願日2024-03-28
基礎出願国GB
出願人Malvern Panalytical B.V.
OCRテキストREVONTIUM
OCRテキスト2REVONTIUM
OCRについて
この商標をJ-PlatPatで参照する

関連商標

株式会社CaTe
ケアリハ CAREREHAB
2日前
クレアニーズ株式会社
EatColo
4か月前
個人
4か月前
深せんりん一種生活文化創意有限公司
4か月前
株式会社KOKOBI
4か月前
株式会社フロスト
4か月前
株式会社OpenDNA
4か月前
株式会社コロプラ
4か月前
株式会社コロプラ
4か月前
一般社団法人日本外科学会
4か月前
一般社団法人日本外科学会
4か月前
クレアニーズ株式会社
#
4か月前
クレアニーズ株式会社
TreTra
4か月前
株式会社喜喜
水位盤
4か月前
青山田下品牌管理(上海)有限公司
4か月前
株式会社喜喜
ΚΙΚΙ WORKS
4か月前
株式会社関西広告社
かがやく家系図
4か月前
株式会社喜喜
tan
4か月前
株式会社喜喜
タンジェント
4か月前
弥生株式会社
BizxBiz
4か月前
株式会社ジンズホールディングス
チークメガネ
4か月前
株式会社ジンズホールディングス
チークレンズ
4か月前
株式会社シティーデジタル
CommunicationStats コミュニケーションスタッツ
4か月前
Ascella Bio JAPAN株式会社
AscellaOne
4か月前
株式会社エモーショナル・テクノロジーズ
VenturaASI
4か月前
東レ株式会社
4か月前
個人
4か月前
深セン市華シン龍文化科技有限公司
4か月前
深せん格珞鋭科技有限公司
4か月前
株式会社第一興商
4か月前
東電設計株式会社
4か月前
東電設計株式会社
4か月前
東電設計株式会社
4か月前
東電設計株式会社
4か月前
東電設計株式会社
4か月前
東電設計株式会社
4か月前
続きを見る