商標ウォッチ

公開日2024-11-07
公報種別公開国際商標公報
国際登録番号1808348
国際登録日2024-02-27
区分第1類(化学品),第5類(薬剤),第9類(機械器具),第10類(医用機器),第37類(建設),第42類(科学・技術),第44類(医療・農林業)
商品役務Reagents for research purposes; cell culture media for scientific and research use; biochemical preparations for scientific purposes; fluorescently labeled reagents for scientific or medical research use.,Diagnostic kits comprised of medical diagnostic reagents and assays for testing bodily fluids, in particular PCR test kits and test kits for biochemical analysis.,Scientific apparatus, namely, spectrometers and parts and fittings therefor; scientific apparatus, namely, mass spectrometers; ion mobility spectrometers; scientific apparatus, namely, surface plasmon resonance spectrometers; scientific apparatus, namely, infrared, near infrared, optical, UV, terahertz and raman spectrometers and analyzers; scientific apparatus, namely, handheld raman devices being spectrometers; scientific apparatus 全 107 件を表示, namely, nuclear magnetic resonance (NMR) spectrometers; scientific apparatus, namely, time domain NMR devices being spectrometers; scientific apparatus, namely, electron paramagnetic resonance spectrometers; scientific apparatus, namely, X-ray fluorescence (XRF) spectrometers and handheld XRF devices being spectrometers; scientific apparatus, namely, optical emission spectrometers; devices for force spectroscopy; scientific apparatus, namely, energy dispersive and wavelength dispersive X-ray spectrometers; handheld and mobile nanoscale spectrometer systems; components of spectrometers, in particular, nuclear magnetic resonance (NMR) probes, NMR and electron paramagnetic resonance (EPR) cryostats and magnets; gas and liquid chromatography apparatus; microscopes, namely, infrared and raman microscopes, X-ray microscopes, atomic force microscopes, atomic force-infrared microscopes, fluorescence microscopes, scanning probe microscopes, and electron microscopes; accessories for microscopes, namely, atomic force microscope cantilevers and optical objectives; instruments for measuring mechanical and dimensional properties, namely, nanomechanical test systems, devices for mechanical and dimensional metrology, tribometers, nanoindenters, devices for nanoscale thermal analysis, surface roughness measurement instruments, mechanical and optical profilometers, white light interferometers; sample holding and preparation instruments, namely, optical tweezers and hyperpolarization devices; imaging instruments and tomographs, in particular, magnetic resonance imaging tomographs, nuclear molecular imaging devices, devices for magnetic particle imaging, electron paramagnetic resonance imaging devices, computerized tomography scanners, optical imaging scanners, x-ray diffraction imaging systems and multi-modal imaging devices; accessories for imaging systems, namely, sample holders and animal cradles; X-ray diffractometers and scattering systems, namely, small-angle scattering systems, X-ray reflectivity systems and X-ray inspection systems; accessories for X-ray systems, namely, X-ray sources, X-ray tubes, X-ray optics, X-ray mirrors, one-dimensional and two-dimensional X-ray detectors; instruments for the detection of chemical, biological and radiological threats for military and civil use, implemented as mobile, standalone and stand-off devices; electron paramagnetic resonance sensors; electron backscatter detectors; cmos preamplifiers for detectors; electrical conductors, namely, copper-clad aluminum electrical conductors; low temperature superconductors, in particular nbti, nb3sn superconductors; high temperature superconductors, in particular bi-2212 superconductors; powder in tube superconductors; tape or wire superconductors; devices for laboratory and factory automation, in particular, devices for automation of sample preparation, sample transport, sample exchange and sample retention, and rotatable sample holders; biological and microbiological workstations and test systems, in particular incubators for hybridization of nucleic acids, devices for nucleic acid extraction, cellular fluorescence screeners and workstations; photomask repair products being afm-guided nanomachining systems, femto-pulse laser repair systems, and cryogenic and laser based cleaning systems for wafers and photomasks; magnetic head cleaners for photomasks and semiconductor wafers; downloadable and recorded software for operating and controlling scientific and analytical instruments; downloadable and recorded software for measurement automation; downloadable and recorded software for data acquisition, processing and analysis; downloadable and recorded software for image reconstruction, processing, analysis and visualization; downloadable and recorded software for laboratory data management; downloadable and recorded software for communication between laboratory components; downloadable and recorded software for cloud-based scientific informatics tools.,Medical instruments for microbiological and molecular biological diagnosis; medical apparatus, namely, polymerase chain reaction (PCR) thermocyclers.,Installation, maintenance, and repair of scientific instruments.,Scientific and technological services, namely, services for the analysis of laboratory data, food analysis being performance of chemical analyses; services for cell and tissue analysis for use in clinical trials.,Medical services, namely, clinical diagnostics services for cell and tissue analysis in clinical and pharmaceutical applications.
基礎出願番号97154634
基礎出願日2021-12-03
基礎出願国US
出願人Bruker Corporation
OCRテキストBKRUKEK
OCRテキスト2BRUKER
OCRについて

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